 Engineered Solutions - RF Component / Assembly Testing
Engineering services offers our customer the capability of performing RF tests on components and assemblies. Fully automated test systems are used for volume production. Test data is electronically stored and can be supplied per our customers' requests.
Component Testing
TESTING AND SORTING (BINNING) of DC Parameters for Bipolar and MOSFET Devices
- Bipolar - V(BR)CBO V(BR)CES V(BR)CEO V(BR)EBO ICBO ICES IEBO and hFE
- MOSFET - V(BR)DSS IDSS IGSS VGS(TH) VDS(ON) and gfs
MATCHED DEVICES - Devices should be matched if being paralleled or used in a push-pull circuit.
- hFE - DC current gain (for bipolar transistors)
- gfs - Forward Transconductance (for FETs)
- Gate Threshold Voltage (for FETs)
- Power Gain (Requires customer's test fixture)
- Other parameters that customer may require
 SELECTION OF TRANSISTORS TO SPECIFIC PARAMETER RANGES
- hFE - DC current gain (for bipolar transistors)
- gfs - Forward Transconductance (for FETs)
- Gate Threshold Voltage (for FETs)
- Other parameters that customer may require
SELECTION OF LOW LEAKAGE CURRENT DEVICES
- Selection of devices with low reversed biased junction currents
RF TESTING (Requires customer's test fixture)
- IMD - Intermodulation Distortion
- IP3 - Third Order Intercept
- Power output
- Gain
- Other parameters that customer may require
PROVIDE HARD COPY OF TEST DATA
MODIFICATIONS
- Branding to customer specifications
- Cutting/Milling of leads, flanges and studs
- Special lead trimming and forming
- Gold-plating of flanges and studs
- Enlarge flange holes
CUSTOM BRANDING/MARKING
- Brand device with customer's part number
- Color dots or letter codes for sorting and selection
- Alphanumeric codes for date, lot, etc.
Assembly Testing
EQUIPMENT
- Network Analyzers to 20 GHz
- Spectrum Analyzers to 13.2 GHz
- Vector Signal Analyzers to 4 GHz
- Signal Generators to 3 GHz
- Attenuators up to 1 kW
TESTING CAPABILITIES
- Automated Test - Fully automated test systems are used for volume production. Test data is electrically stored and can be supplied per our customer's request.
- Network Analysis - Gain, Phase, Group Delay, VSWR
- Power Measurement - CW, Channel Power, ACPR, Efficiency
- Spectrum Analysis - Intermodulation, Harmonics, Spurious, Spectral Content (CDMA mask)
- Test Fixtures - Designed per customer's Unit Under Test (UUT)
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